Miláček čtenářů je právě vyprodaný
Parametry
- 322 stránek
- 12 hodin čtení
Více o knize
This book explores the design implications of emerging, non-volatile memory (NVM) technologies on future computer memory hierarchy architecture designs. Since NVM technologies combine the speed of SRAM, the density of DRAM, and the non-volatility of Flash memory, they are very attractive as the basis for future universal memories. This book provides a holistic perspective on the topic, covering modeling, design, architecture and applications. The practical information included in this book will enable designers to exploit emerging memory technologies to improve significantly the performance/power/reliability of future, mainstream integrated circuits.
Nákup knihy
Emerging Memory Technologies, Yuanyuan Xie
- Jazyk
- Rok vydání
- 2013
- product-detail.submit-box.info.binding
- (pevná)
Jakmile se objeví, pošleme e-mail.
Doručení
Platební metody
Tady nám chybí tvá recenze.
- Titul
- Emerging Memory Technologies
- Podtitul
- Design, Architecture, and Applications
- Jazyk
- anglicky
- Autoři
- Yuanyuan Xie
- Vydavatel
- Springer-Verlag GmbH
- Rok vydání
- 2013
- Vazba
- pevná
- Počet stran
- 322
- ISBN10
- 1441995501
- ISBN13
- 9781441995506
- Série
- Štítky
- Naučná literatura, Umění & Kultura, Technologie & Průmysl, Architektura, Architektura & Urbanismus, Počítače & Internet, USA, Technologie, Strojírenství, Elektronika, Systémové inženýrství
- Hodnocení
- 5 z 5
- Anotace
- This book explores the design implications of emerging, non-volatile memory (NVM) technologies on future computer memory hierarchy architecture designs. Since NVM technologies combine the speed of SRAM, the density of DRAM, and the non-volatility of Flash memory, they are very attractive as the basis for future universal memories. This book provides a holistic perspective on the topic, covering modeling, design, architecture and applications. The practical information included in this book will enable designers to exploit emerging memory technologies to improve significantly the performance/power/reliability of future, mainstream integrated circuits.