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Více o knize
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
Nákup knihy
Scanning electron microscopy, Ludwig Reimer
- Jazyk
- Rok vydání
- 1998
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Doručení
Platební metody
Navrhnout úpravu
- Titul
- Scanning electron microscopy
- Jazyk
- anglicky
- Autoři
- Ludwig Reimer
- Vydavatel
- Springer
- Rok vydání
- 1998
- ISBN10
- 3540639764
- ISBN13
- 9783540639763
- Kategorie
- Fyzika
- Anotace
- Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.