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Scanning Electron Microscopy

Více o knize

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

Vydání

Nákup knihy

Scanning Electron Microscopy, Rudolf Reichelt

Jazyk
Rok vydání
2010
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