Knihu momentálně nemáme skladem
Parametry
Více o knize
"Novel Algorithms for Fast Statistical Analysis of Scaled Circuits" addresses the challenges posed by manufacturing imperfections in nanometer-scale VLSI technology. It combines methods from computational finance, machine learning, and actuarial risk to develop innovative solutions for efficient statistical analysis of integrated circuits in this advanced domain.
Nákup knihy
Novel Algorithms for Fast Statistical Analysis of Scaled Circuits, Amith Singhee, Rob A. Rutenbar
- Jazyk
- Rok vydání
- 2012
- product-detail.submit-box.info.binding
- (měkká)
Jakmile se objeví, pošleme e-mail.
Doručení
Platební metody
Nikdo zatím neohodnotil.