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Surface Microscopy with Low Energy Electrons

Parametry

Počet stran
516 stránek
Čas čtení
19 hodin

Více o knize

Focusing on advanced imaging techniques, this book delves into surface physics and thin film research, highlighting methods utilizing low energy electrons. It provides in-depth coverage of innovative techniques such as Low Energy Electron Microscopy (LEEM), Spin-Polarized Low Energy Electron Microscopy (SPLEEM), and Photoemission Electron Microscopy (PEEM), among others. The author, a pioneer in the field, presents fundamental principles, experimental setups, and practical applications, complemented by numerous illustrations to enhance understanding of electron optics and results.

Nákup knihy

Surface Microscopy with Low Energy Electrons, Erns W. Bauer

Jazyk
Rok vydání
2014
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