VLSI-SoC: Design for Reliability, Security, and Low Power
23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers
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This book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, held in Daejeon, Korea, in October 2015. The 10 papers included in the book were carefully reviewed and selected from the 44 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about new challenges both at the physical and system-design levels, as well as in the test of these systems.
Nákup knihy
VLSI-SoC: Design for Reliability, Security, and Low Power, Youngsoo Shin
- Jazyk
- Rok vydání
- 2018
Doručení
Platební metody
Navrhnout úpravu
- Titul
- VLSI-SoC: Design for Reliability, Security, and Low Power
- Podtitul
- 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers
- Jazyk
- anglicky
- Autoři
- Youngsoo Shin
- Vydavatel
- Springer
- Rok vydání
- 2018
- ISBN10
- 3319834401
- ISBN13
- 9783319834405
- Kategorie
- Počítače, IT, programování
- Anotace
- This book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, held in Daejeon, Korea, in October 2015. The 10 papers included in the book were carefully reviewed and selected from the 44 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about new challenges both at the physical and system-design levels, as well as in the test of these systems.